Q8344A

可以进行连续测量的光谱分析仪爱德万Q8344A

●连续测量

●1.5秒/扫描的高速测量

●0.35¦m到1.75¦m的宽波长范围

●0.1nm的波长测量精度 Q8344A光谱分析仪

Q8344A是具有0.35到1.75¦m的宽波长范围的光谱分析仪。在傅立叶光谱系统中,迈克尔逊干涉仪的应用使单色器的离散光谱系统所不能进行的连续分析成为可能。它显示了评估CD和视频光盘的激光二极管的能力。作为参考波长的内置HE-NE激光器可以识别¡0.1nm(1.3nm) 的波长精度甚至在不经过波长校准的情况下也可以保证长期的测量稳定性。 Q8344A提供了0.05nm(在0.85¦m)的波长分辨率适合于测量窄模式间隔的激光二极管。不论分析的跨度多少测量速度进约为1.5秒在0.4¦m到1.05¦m和0.8¦m到1.75¦m使它可以作为系统一部分。 Q8344A具有全面的显示、分析和处理功能它可以对诸如激光二极管和LED之类的光发射元件以及光纤和滤波器光元件进行特性测量。连续测量由于Q8344A使用了迈克尔逊干涉仪它可以进行连续测量。这项功能使它可以轻松地对视频光盘的激光二极管的回光所引起的噪声抑制进行评估分析范围大约为¡10mm。 1.5秒/扫描的高速测量 Q8344A采用傅立叶频谱系统因而对任何的测量跨度和灵敏度都可以在1.5秒内完成测量。(提供起始波长是0.4¦m或更长并且测量不能同时覆盖短的波长和长波长)。因此分析仪适合于测量生产线上的激光二极管和LED并且可以评估光纤和滤波器的传输和损耗的特征。当作为系统组成部分时分析仪只需要1.5秒就可以完成触发测量和数据输出。 0.05nm的波长范围在短波长(0.85¦m)时Q8344A提供0.05nm的分辨率使它可以以全分解振荡模式依次对CD和可视光激光二极管进行测量。大量规光纤输出选件 200¦m大量输出可以作为选件使用。当分析波长大于标准光纤量规(GI50¦m)的装置时可选用此选件。对激光二极管分析推荐标准50-¦m规格对LED分析推荐选用规格。

Can Ed spectrum analyzer continuous measurement of Q8344A million

- continuous measurement

High speed measuring 1.5 seconds / scan -

The 0.35 fields of m to 1.75 fields of wide wavelength range M

The wavelength measurement precision of Q8344A spectrum analyzer - 0.1nm

Q8344A is a spectrum analyzer in wide wavelength range with 0.35 to 1.75 fields of M. In the Fourier spectrum of the system and Michelson interferometer instrument application the monochromator of discrete spectrum system can continuous analysis becomes possible. It shows the ability of the laser diode to evaluate CD and video discs. As the reference wavelength of built-in He-Ne laser can be recognition "0.1nm (1.3 nm) wavelength accuracy even without wavelength calibration can ensure the long-term stability of measurement. Q8344A provides maximum 0.05nm (in the 0.85 fields of M) laser diode wavelength resolution suitable for measuring narrow interval model. No matter analysis span many measurement speed into the about 1.5 seconds ribution in 0.4 m able to 1.05 able to m and 0.8 m able to m to 175 able m carnosine so that it can be used as part of a system. Q8344A has comprehensive display, analysis and processing functions it can such as a laser diode and LED light emission element and optical fiber and optical filter element characteristic measurement. The continuous measurement of Q8344A using a Michelson interferometer it can continuously measure. This feature makes it possible to easily on the video disc laser diode light echoes caused by noise suppression of analysis about "10mm assessment. 1.5 seconds / scanning speed measurement Q8344A using Fourier spectrum system so on any of the measurements span and sensitivity can be in 1.5 seconds to complete the measurement. (the starting wavelength is 0.4 m or more fields and the measurement can not cover the short wavelength and long wavelength at the same time). The analyzer suitable to the measurement of production line of laser diode and led and evaluate the characteristics of the transmission and loss of fiber, and filter. When a part of the system when the analyzer only need 1.5 seconds to complete the trigger measurement and data output. 0.05nm at maximum wavelength range in the short wavelength (0.85 able m) Q8344A provides a 0.05nm maximum resolution enable it to full decomposition oscillation modes in order to CD and visible light laser diode were measured. A large number of rules in the fields of optical fiber output option 200 m output can be used as an option. When the analysis wavelength is greater than the standard gauge (GI50 m fields) optical fiber devices can choose this option. Analysis of laser diode recommended standard 50- m specifications for LED analysis fields recommended specifications.