武训科技-网络分析仪E5000系列

主要特性与技术指标 ?广泛的动态范围：在测试端口处具有 > 123 dB 的动态范围（典型值）

?极快的测量速度：全双端口校准时为 41 ms，1601 点

?低迹线噪声：70 kHz 中频带宽（IFBW）处为 0.004 dB rms

?集成的 S 参数测试装置

?端口选项：2 端口和 4 端口

?平衡测量能力（4 端口选件）

?频率选件：9 kHz 至 4.5 GHz/8.5 GHz、100 kHz 至 4.5 GHz/8.5 GHz （带有偏置 T 型接头）、300 kHz 至 20 GHz（带有偏置 T 型接头）

?内置 Visual Basic 应用程序设计语言（VBA）

描述

E5071C 网络分析仪具有同类产品中的射频性能和***快的速度，并具有宽频率范围和全面的功能。它是制造和研发工程师们测试频率范围在 20 GHz 以内的射频元器件和电路的理想解决方案。

特性：新款 20 GHz 选件可将 E5071C ENA 系列网络分析仪的频率范围扩展至 20 GHz。新款 20 GHz 选件支持双端口（选件 2K5）和四端口（选件 4K5）两种配置，可用于测量各种成分，例如 WLAN、WiMAX、UWB 或任何 4G 技术中的无源器件的第三个谐波。

E5071C-008

Frequency offset mode

Frequency offset modeE5071C-008

Transmission response measurement of devices such as mixers and converters.

Frequency-offset sweep, SMC, VMC, external signal generator control and harmonic distortion measurement

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E5071C-010

Time domain analysis

Time domain analysisE5071C-010

Reflection and transmission responses in the time domain

Up to 20,001 point measurement with low-pass or band-pass mode selection

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E5071C-017Removable Data StorageE5071C-019Standard Data StorageE5071C-1A7Calibration + Uncertainties + GuardbandingE5071C-1CMRack mount kitE5071C-1CNFront handle kitE5071C-1CPRack mount and front handle kitE5071C-1E5High stability timebaseE5071C-2402-port Test Set, 9 kHz to 4.5 GHz without Bias TeesE5071C-2452-port Test Set, 100 kHz to 4.5 GHz with Bias TeesE5071C-2602-port Test Set, 9 kHz to 6.5 GHz without Bias TeesE5071C-2652-port Test Set, 100 kHz to 6.5 GHz with Bias TeesE5071C-2802-port Test Set, 9 kHz to 8.5 GHz without Bias TeesE5071C-2852-port Test Set, 100 kHz to 8.5 GHz with Bias TeesE5071C-2D52-port Test Set, 300 kHz to 14 GHz with Bias TeesE5071C-2K52-port Test Set, 300 kHz to 20 GHz with Bias TeesE5071C-4404-port Test Set, 9 kHz to 4.5 GHz without Bias TeesE5071C-4454-port Test Set, 100 kHz to 4.5 GHz with Bias TeesE5071C-4604-port Test Set, 9 kHz to 6.5 GHz without Bias TeesE5071C-465

4-port Test Set, 100 kHz to 6.5 GHz with Bias Tees

4-port Test Set, 100 kHz to 6.5 GHz with Bias TeesE5071C-465

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E5071C-4804-port Test Set, 9 kHz to 8.5 GHz without Bias TeesE5071C-4854-port Test Set, 100 kHz to 8.5 GHz with Bias TeesE5071C-4D54-port Test Set, 300 kHz to 14 GHz with Bias TeesE5071C-4K54-port Test Set, 300 kHz to 20 GHz with Bias TeesE5071C-790

Measurement wizard assistant software

Measurement wizard assistant softwareE5071C-790

Easy and fast measurement setup for the multiport device testing

Available for 4-port E5071C network analyzers and the multiport test set E5091A/E5092A

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E5071C-810Add keyboardE5071C-820Add mouseE5071C-A6JANSI Z540-1-1994 CalibrationE5071C-TDR

Enhanced Time Domain Analysis

Enhanced Time Domain AnalysisE5071C-TDR

Real time measurements simultaneously in time domain (TDR/TDT) and frequency domain (S-parameters)

Eye diagram tests without external bit pattern generator

Stressed eye diagram analysis of interconnects

Impedance analysis of active devices

ESD Robustness

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E5071C-UNQStandard stability timebaseE5092A